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Sunday, January 27, 2013

CI 9224 ADVANCED METROLOGY AND COMPUTER AIDED INSPECTION SYLLABUS | ANNA UNIVERSITY ME COMPUTER INTEGRATED MANUFACTURING 2nd Semester SYLLABUS REGULATION 2009 2011 2012-2013

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CI 9224 ADVANCED METROLOGY AND COMPUTER AIDED INSPECTION  SYLLABUS | ANNA UNIVERSITY ME COMPUTER INTEGRATED MANUFACTURING 2nd Semester SYLLABUS REGULATION 2009 2011 2012-2013 BELOW IS THE ANNA UNIVERSITY M.E COMPUTER INTEGRATED MANUFACTURING DEPARTMENT 2nd Sem SYLLABUS, TEXTBOOKS, REFERENCE BOOKS,EXAM PORTIONS,QUESTION BANK,PREVIOUS YEAR QUESTION PAPERS,MODEL QUESTION PAPERS, CLASS NOTES, IMPORTANT 2 MARKS, 8 MARKS, 16 MARKS TOPICS. IT IS APPLICABLE FOR ALL STUDENTS ADMITTED IN THE YEAR 2011 2012-2013 (ANNA UNIVERSITY CHENNAI,TRICHY,MADURAI,TIRUNELVELI,COIMBATORE), 2009 REGULATION OF ANNA UNIVERSITY CHENNAI AND STUDENTS ADMITTED IN ANNA UNIVERSITY CHENNAI DURING 2010

CI 9224 ADVANCED METROLOGY AND COMPUTER AIDED INSPECTION  L T P C
3 0 0 3
AIM:
To give a thorough knowledge of measurement and instrumentation of increasing
importance in industry. The student will be knowledgeable in various standards and
proliferation of computerized and automated inspecting techniques along with the
classical metrology.
OBJECTIVES:
 To teach the students basic concepts in various methods of engineering
measurement techniques and applications, understand the importance of
measurement and inspection in manufacturing industries.
 Expose the students to various modern metrological instruments and the
procedure used to operate these instruments.
UNIT I GENERAL CONCEPTS OF MEASUREMENT 8
Definition – Standards of measurement – Errors in measurement – Interchangeability
and Selective assembly – Accuracy and Precision – Calibration of instruments.
UNITII MEASUREMENT OF SURFACE FINISH AND
MEASURING MACHINES 9
Definitions – Types of Surface Texture: Surface Roughness Measurement Methods-
Comparison, Profilometer, 3D Surface Roughness Measurement – Instruments.
UNIT III INTERFEROMETRY 8
Interferometry – Introduction, Principles of light interference – Interferometers –
Measurement and Calibration – Laser Interferometry.
UNIT IV COMPUTER AIDED AND LASER METROLOGY 10
Tool Makers Microscope – Microhite – Co – Ordinate measuring machine –
Applications – Laser Micrometer, Laser Scanning gauge, Non contact and in-process
inspection, Vision system.
UNIT V IMAGE PROCESSING 10
Overview, Computer imaging systems, Image Analysis, Preprocessing, Human vision
system, Image model, Image enhancement, gray scale models, histogram models,
Image Transforms
TOTAL: 45 PERIODS
7
TEXT BOOK:
1. GUPTA, I.C, “A Text Book of engineering metrology”, Dhanpat Rai and Sons,
1996.
REFERENCES:
1. G.N.GALYER F.W. and C.R.SHOTBOLT, “Metrology for engineers”, ELBS,
1990.
2. GRAHAM T.SMITH, “Industrial Metrology”, Springer, 2002
3. “ASTE Handbook of Industries Metrology”, Prentice Hall of India Ltd., 1992.
4. R.K.RAJPUT, “Engineering Metrology and Instrumentations”, Kataria & Sons
Publishers, 2001.
5. MILAN SONKA, VACLAV HLAVAC and ROGER BOYLE, “Image Processing,
Analysis, and Machine Vision”, Cengage-Engineering; 3 edition (March 19,
2007).
WEB REFERENCES:
1. www.metrologytooling.com
2. www.iuk’tu-harburg.de

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